Machine Learning Techniques for Escaped Defect Analysis in Software Testing

Lidia Perside Gomes Nascimento, Ricardo Bastos Cavalcante Prudêncio, Alexandre Cabral Mota, Audir de Araujo Paiva Filho, Pedro Henrique Alves Cruz, Daniel Cardoso Coelho Alves de Oliveira, Pedro Roncoli Sarmet Moreira. Machine Learning Techniques for Escaped Defect Analysis in Software Testing. In Awdren L. Fontão, Débora M. B. Paiva, Hudson Borges, Maria Istela Cagnin, Patrícia Gomes Fernandes, Vanessa Borges, Silvana M. Melo, Vinicius H. S. Durelli, Edna Dias Canedo, editors, 8th Brazilian Symposium on Systematic and Automated Software Testing, SAST 2023, Campo Grande, MS, Brazil, September 25-29, 2023. pages 47-53, ACM, 2023. [doi]

Abstract

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