Nidhi Nasiar, Ryan S. Baker, Jillian Li, Weiyi Gong. How do A/B Testing and Secondary Data Analysis on AIED Systems Influence Future Research?. In Maria Mercedes Rodrigo, Noburu Matsuda, Alexandra I. Cristea, Vania Dimitrova, editors, Artificial Intelligence in Education - 23rd International Conference, AIED 2022, Durham, UK, July 27-31, 2022, Proceedings, Part I. Volume 13355 of Lecture Notes in Computer Science, pages 115-126, Springer, 2022. [doi]
@inproceedings{NasiarBLG22,
title = {How do A/B Testing and Secondary Data Analysis on AIED Systems Influence Future Research?},
author = {Nidhi Nasiar and Ryan S. Baker and Jillian Li and Weiyi Gong},
year = {2022},
doi = {10.1007/978-3-031-11644-5_10},
url = {https://doi.org/10.1007/978-3-031-11644-5_10},
researchr = {https://researchr.org/publication/NasiarBLG22},
cites = {0},
citedby = {0},
pages = {115-126},
booktitle = {Artificial Intelligence in Education - 23rd International Conference, AIED 2022, Durham, UK, July 27-31, 2022, Proceedings, Part I},
editor = {Maria Mercedes Rodrigo and Noburu Matsuda and Alexandra I. Cristea and Vania Dimitrova},
volume = {13355},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-031-11644-5},
}