Leila Naslavsky, Debra J. Richardson. Using traceability to support model-based regression testing. In R. E. Kurt Stirewalt, Alexander Egyed, Bernd Fischer, editors, 22nd IEEE/ACM International Conference on Automated Software Engineering (ASE 2007), November 5-9, 2007, Atlanta, Georgia, USA. pages 567-570, ACM, 2007. [doi]
Abstract is missing.