On the improvement of a fault classification scheme with implications for white-box testing - researchr publication authors

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Shimul Kumar Nath, Robert Merkel, Man Fai Lau. On the improvement of a fault classification scheme with implications for white-box testing. In Sascha Ossowski, Paola Lecca, editors, Proceedings of the ACM Symposium on Applied Computing, SAC 2012, Riva, Trento, Italy, March 26-30, 2012. pages 1123-1130, ACM, 2012. [doi]

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