Shimul Kumar Nath, Robert Merkel, Man Fai Lau. On the improvement of a fault classification scheme with implications for white-box testing. In Sascha Ossowski, Paola Lecca, editors, Proceedings of the ACM Symposium on Applied Computing, SAC 2012, Riva, Trento, Italy, March 26-30, 2012. pages 1123-1130, ACM, 2012. [doi]
@inproceedings{NathML12,
title = {On the improvement of a fault classification scheme with implications for white-box testing},
author = {Shimul Kumar Nath and Robert Merkel and Man Fai Lau},
year = {2012},
doi = {10.1145/2245276.2231953},
url = {http://doi.acm.org/10.1145/2245276.2231953},
researchr = {https://researchr.org/publication/NathML12},
cites = {0},
citedby = {0},
pages = {1123-1130},
booktitle = {Proceedings of the ACM Symposium on Applied Computing, SAC 2012, Riva, Trento, Italy, March 26-30, 2012},
editor = {Sascha Ossowski and Paola Lecca},
publisher = {ACM},
isbn = {978-1-4503-0857-1},
}