Amorphous silicon technology for large area digital X-ray and optical imaging

Arokia Nathan, Byung-kyu Park, Qinghua Ma, Andrei Sazonov, John A. Rowlands. Amorphous silicon technology for large area digital X-ray and optical imaging. Microelectronics Reliability, 42(4-5):735-746, 2002. [doi]

Authors

Arokia Nathan

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Byung-kyu Park

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Qinghua Ma

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Andrei Sazonov

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John A. Rowlands

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