Amorphous silicon technology for large area digital X-ray and optical imaging

Arokia Nathan, Byung-kyu Park, Qinghua Ma, Andrei Sazonov, John A. Rowlands. Amorphous silicon technology for large area digital X-ray and optical imaging. Microelectronics Reliability, 42(4-5):735-746, 2002. [doi]

Abstract

Abstract is missing.