Multilayer Deposition in Phase-Change Memory for Best Endurance Performance and Reduced Bit Error Rate

Gabriele Navarro, C. Sabbione, V. Meli, L. E. Nistor, M. Frei, Julien Garrione, M. Tessaire, F. Fillot, Nicolas Bernier, Emmanuel Nolot, Benoit Sklénard, J. Li, S. Martin, Niccolo Castellani, Guillaume Bourgeois, Marie-Claire Cyrille, François Andrieu. Multilayer Deposition in Phase-Change Memory for Best Endurance Performance and Reduced Bit Error Rate. In IEEE International Memory Workshop, IMW 2022, Dresden, Germany, May 15-18, 2022. pages 1-4, IEEE, 2022. [doi]

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