Naman Nayak, Deepak Kumar, Abhiraj Malhotra. Crop Health Monitoring: YOLACT Deep Learning Model and Histogram Equalization for Enhanced Leaf Blight Detection. In 7th International Conference on Contemporary Computing and Informatics, IC3I 2024, Greater Noida, India, September 18-20, 2024. pages 485-490, IEEE, 2024. [doi]
Abstract is missing.