Patrick Ndai, Shih-Lien Lu, Dinesh Somasekhar, Kaushik Roy. Fine-Grained Redundancy in Adders. In 8th International Symposium on Quality of Electronic Design (ISQED 2007), 26-28 March 2007, San Jose, CA, USA. pages 317-321, IEEE Computer Society, 2007. [doi]
Abstract is missing.