Performance vs. reliability adaptive body bias scheme in 28 nm & 14 nm UTBB FDSOI nodes

C. Ndiaye, V. Huard, X. Federspiel, Florian Cacho, Alain Bravaix. Performance vs. reliability adaptive body bias scheme in 28 nm & 14 nm UTBB FDSOI nodes. Microelectronics Reliability, 64:158-162, 2016. [doi]

Abstract

Abstract is missing.