A Two Stage Contour Evolution Approach for the Measurement of Choroid Thickness in EDI-OCT Images

George Neetha, C. V. Jiji. A Two Stage Contour Evolution Approach for the Measurement of Choroid Thickness in EDI-OCT Images. In Renu Rameshan, Chetan Arora 0001, Sumantra Dutta Roy, editors, Computer Vision, Pattern Recognition, Image Processing, and Graphics - 6th National Conference, NCVPRIPG 2017, Mandi, India, December 16-19, 2017, Revised Selected Papers. Volume 841 of Communications in Computer and Information Science, pages 436-445, Springer, 2017. [doi]

Authors

George Neetha

This author has not been identified. Look up 'George Neetha' in Google

C. V. Jiji

This author has not been identified. Look up 'C. V. Jiji' in Google