George Neetha, C. V. Jiji. A Two Stage Contour Evolution Approach for the Measurement of Choroid Thickness in EDI-OCT Images. In Renu Rameshan, Chetan Arora 0001, Sumantra Dutta Roy, editors, Computer Vision, Pattern Recognition, Image Processing, and Graphics - 6th National Conference, NCVPRIPG 2017, Mandi, India, December 16-19, 2017, Revised Selected Papers. Volume 841 of Communications in Computer and Information Science, pages 436-445, Springer, 2017. [doi]
@inproceedings{NeethaJ17,
title = {A Two Stage Contour Evolution Approach for the Measurement of Choroid Thickness in EDI-OCT Images},
author = {George Neetha and C. V. Jiji},
year = {2017},
doi = {10.1007/978-981-13-0020-2_38},
url = {https://doi.org/10.1007/978-981-13-0020-2_38},
researchr = {https://researchr.org/publication/NeethaJ17},
cites = {0},
citedby = {0},
pages = {436-445},
booktitle = {Computer Vision, Pattern Recognition, Image Processing, and Graphics - 6th National Conference, NCVPRIPG 2017, Mandi, India, December 16-19, 2017, Revised Selected Papers},
editor = {Renu Rameshan and Chetan Arora 0001 and Sumantra Dutta Roy},
volume = {841},
series = {Communications in Computer and Information Science},
publisher = {Springer},
isbn = {978-981-13-0020-2},
}