Jay J. Nejedlo. IBISTTM (Interconnect Built-in Self-Test) Architecture and Methodology for PCI Express: Intel?s Next-Generation Test and Validation Methodology for Performance IO. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 784, IEEE Computer Society, 2003. [doi]
Abstract is missing.