On-chip calibration technique for delay line based BIST jitter measurement

Bryan Nelson, Mani Soma. On-chip calibration technique for delay line based BIST jitter measurement. In ISCAS (4). pages 944-947, 2004. [doi]

@inproceedings{NelsonS04:0,
  title = {On-chip calibration technique for delay line based BIST jitter measurement},
  author = {Bryan Nelson and Mani Soma},
  year = {2004},
  doi = {10.1109/ISCAS.2004.1328352},
  url = {http://dx.doi.org/10.1109/ISCAS.2004.1328352},
  tags = {rule-based},
  researchr = {https://researchr.org/publication/NelsonS04%3A0},
  cites = {0},
  citedby = {0},
  pages = {944-947},
  booktitle = {ISCAS (4)},
}