Fast thermal profiling of power semiconductor devices using Fourier techniques

Jody J. Nelson, Giri Venkataramanan, Ayman M. El-Refaie. Fast thermal profiling of power semiconductor devices using Fourier techniques. IEEE Transactions on Industrial Electronics, 53(2):521-529, 2006. [doi]

Authors

Jody J. Nelson

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Giri Venkataramanan

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Ayman M. El-Refaie

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