Jody J. Nelson, Giri Venkataramanan, Ayman M. El-Refaie. Fast thermal profiling of power semiconductor devices using Fourier techniques. IEEE Transactions on Industrial Electronics, 53(2):521-529, 2006. [doi]
@article{NelsonVE06,
title = {Fast thermal profiling of power semiconductor devices using Fourier techniques},
author = {Jody J. Nelson and Giri Venkataramanan and Ayman M. El-Refaie},
year = {2006},
doi = {10.1109/TIE.2006.870714},
url = {http://dx.doi.org/10.1109/TIE.2006.870714},
researchr = {https://researchr.org/publication/NelsonVE06},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Industrial Electronics},
volume = {53},
number = {2},
pages = {521-529},
}