Self-timed automatic test pattern generation for null convention logic - researchr publication authors

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Nastaran Nemati, Mark C. Reed, Sri Parameswaran, Karl M. Fant. Self-timed automatic test pattern generation for null convention logic. In IEEE 59th International Midwest Symposium on Circuits and Systems, MWSCAS 2016, Abu Dhabi, United Arab Emirates, October 16-19, 2016. pages 1-4, IEEE, 2016. [doi]

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