Nastaran Nemati, Mark C. Reed, Sri Parameswaran, Karl M. Fant. Self-timed automatic test pattern generation for null convention logic. In IEEE 59th International Midwest Symposium on Circuits and Systems, MWSCAS 2016, Abu Dhabi, United Arab Emirates, October 16-19, 2016. pages 1-4, IEEE, 2016. [doi]
Abstract is missing.