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No-reference image quality assessment based on local binary patterns

I. Nenakhov, Vladimir V. Khryashchev, Andrey L. Priorov. No-reference image quality assessment based on local binary patterns. In 2016 IEEE East-West Design & Test Symposium, EWDTS 2016, Yerevan, Armenia, October 14-17, 2016. pages 1-4, IEEE, 2016. [doi]

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