On the Relaxation of n-detect Test Sets

Stelios Neophytou, Maria K. Michael. On the Relaxation of n-detect Test Sets. In 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA. pages 187-192, IEEE Computer Society, 2008. [doi]

Abstract

Abstract is missing.