Stelios Neophytou, Maria K. Michael, Spyros Tragoudas. Test set enhancement for quality transition faults using function-based methods. In John Lach, Gang Qu, Yehea I. Ismail, editors, Proceedings of the 15th ACM Great Lakes Symposium on VLSI 2005, Chicago, Illinois, USA, April 17-19, 2005. pages 182-187, ACM, 2005. [doi]
@inproceedings{NeophytouMT05,
title = {Test set enhancement for quality transition faults using function-based methods},
author = {Stelios Neophytou and Maria K. Michael and Spyros Tragoudas},
year = {2005},
doi = {10.1145/1057661.1057706},
url = {http://doi.acm.org/10.1145/1057661.1057706},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/NeophytouMT05},
cites = {0},
citedby = {0},
pages = {182-187},
booktitle = {Proceedings of the 15th ACM Great Lakes Symposium on VLSI 2005, Chicago, Illinois, USA, April 17-19, 2005},
editor = {John Lach and Gang Qu and Yehea I. Ismail},
publisher = {ACM},
isbn = {1-59593-057-4},
}