Stelios Neophytou, Maria K. Michael, Spyros Tragoudas. Test set enhancement for quality transition faults using function-based methods. In John Lach, Gang Qu, Yehea I. Ismail, editors, Proceedings of the 15th ACM Great Lakes Symposium on VLSI 2005, Chicago, Illinois, USA, April 17-19, 2005. pages 182-187, ACM, 2005. [doi]
Abstract is missing.