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Statistically translating low-level error probabilities to increase the accuracy and efficiency of reliability simulations in hardware description languages

Drew C. Ness, David J. Lilja. Statistically translating low-level error probabilities to increase the accuracy and efficiency of reliability simulations in hardware description languages. In Vijay Narayanan, Zhiyuan Yan, Enrico Macii, Sanjukta Bhanja, editors, Proceedings of the 18th ACM Great Lakes Symposium on VLSI 2008, Orlando, Florida, USA, May 4-6, 2008. pages 297-302, ACM, 2008. [doi]

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Drew C. Ness

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David J. Lilja

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