Industrial Anomaly Detection on Textures: Multilabel Classification Using MCUs

Ana Teresa Neto, Henrique São Mamede, Vítor Duarte dos Santos. Industrial Anomaly Detection on Textures: Multilabel Classification Using MCUs. In Maria Manuela Cruz-Cunha, Dulce Domingos, Emanuel Peres, Rui Rijo, editors, CENTERIS 2023 - International Conference on ENTERprise Information Systems / ProjMAN - International Conference on Project MANagement / HCist - International Conference on Health and Social Care Information Systems and Technologies 2023, Porto, Portugal, November 8-10, 2023. Volume 239 of Procedia Computer Science, pages 498-505, Elsevier, 2023. [doi]

Abstract

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