Egas Henes Neto, Ivandro Ribeiro, Michele G. Vieira, Gilson I. Wirth, Fernanda Lima Kastensmidt. Evaluating fault coverage of bulk built-in current sensor for soft errors in combinational and sequential logic. In Carlos Galup-Montoro, Sergio Bampi, Alex Orailoglu, editors, Proceedings of the 18th Annual Symposium on Integrated Circuits and Systems Design, SBCCI 2005, Florianolpolis, Brazil, September 4-7, 2005. pages 62-67, ACM, 2005. [doi]
Abstract is missing.