Using Bulk Built-in Current Sensors to Detect Soft Errors

Egas Henes Neto, Ivandro Ribeiro, Michele G. Vieira, Gilson I. Wirth, Fernanda Lima Kastensmidt. Using Bulk Built-in Current Sensors to Detect Soft Errors. IEEE Micro, 26(5):10-18, 2006. [doi]

Abstract

Abstract is missing.