Egas Henes Neto, Gilson I. Wirth, Fernanda Lima Kastensmidt. Mitigating Soft Errors in SRAM Address Decoders Using Built-in Current Sensors. J. Electronic Testing, 24(5):425-437, 2008. [doi]
@article{NetoWK08,
title = {Mitigating Soft Errors in SRAM Address Decoders Using Built-in Current Sensors},
author = {Egas Henes Neto and Gilson I. Wirth and Fernanda Lima Kastensmidt},
year = {2008},
doi = {10.1007/s10836-007-5056-9},
url = {http://dx.doi.org/10.1007/s10836-007-5056-9},
researchr = {https://researchr.org/publication/NetoWK08},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {24},
number = {5},
pages = {425-437},
}