Statistical analysis of systematic and random variability of flip-flop race immunity in 130nm and 90nm CMOS technologies - researchr publication related

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Gustavo Neuberger, Fernanda Gusmão de Lima Kastensmidt, Ricardo Reis, Gilson I. Wirth, Ralf Brederlow, Christian Pacha. Statistical analysis of systematic and random variability of flip-flop race immunity in 130nm and 90nm CMOS technologies. In IFIP VLSI-SoC 2007, IFIP WG 10.5 International Conference on Very Large Scale Integration of System-on-Chip, Atlanta, GA, USA, 15-17 October 2007. pages 78-83, IEEE, 2007. [doi]

The following publications are possibly variants of this publication:

Statistical Analysis of Normality of Systematic and Random Variability of Flip-Flop Race Immunity in 130nm and 90nm CMOS TechnologiesGustavo Neuberger, Gilson I. Wirth, Fernanda Gusmão de Lima Kastensmidt, Ricardo Reis. vlsi 2009: 1-16 [doi]

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