Yannic Neuhaus, Maximilian Augustin, Valentyn Boreiko, Matthias Hein 0001. Spurious Features Everywhere - Large-Scale Detection of Harmful Spurious Features in ImageNet. In IEEE/CVF International Conference on Computer Vision, ICCV 2023, Paris, France, October 1-6, 2023. pages 20178-20189, IEEE, 2023. [doi]
Abstract is missing.