Lattice-Based Patterned Fabric Inspection by Using Total Variation with Sparsity and Low-Rank Representations

Michael K. Ng, Henry Y. T. Ngan, Xiaoming Yuan, Wenxing Zhang. Lattice-Based Patterned Fabric Inspection by Using Total Variation with Sparsity and Low-Rank Representations. SIAM J. Imaging Sciences, 10(4):2140-2164, 2017. [doi]

Authors

Michael K. Ng

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Henry Y. T. Ngan

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Xiaoming Yuan

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Wenxing Zhang

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