Lattice-Based Patterned Fabric Inspection by Using Total Variation with Sparsity and Low-Rank Representations

Michael K. Ng, Henry Y. T. Ngan, Xiaoming Yuan, Wenxing Zhang. Lattice-Based Patterned Fabric Inspection by Using Total Variation with Sparsity and Low-Rank Representations. SIAM J. Imaging Sciences, 10(4):2140-2164, 2017. [doi]

Abstract

Abstract is missing.