Versus-All Class Binarization Strategy for Bearing Diagnostics of Concurrent Defects

Selina S. Y. Ng, Peter W. Tse, Kwok-Leung Tsui. Versus-All Class Binarization Strategy for Bearing Diagnostics of Concurrent Defects. Sensors, 14(1):1295-1321, 2014. [doi]

Abstract

Abstract is missing.