Henry Y. T. Ngan, Grantham K. H. Pang, S. P. Yung, Michael K. Ng. Defect Detection on Patterned Jacquard Fabric. In 32nd Applied Image Pattern Recognition Workshop (AIPR 2003), Image Data Fusion, 15-17 October 2003, Washington, DC, USA, Proceedings. pages 163-168, IEEE Computer Society, 2003. [doi]
Abstract is missing.