Hung Nguyen Ngoc, Jaeyoung Kim, Jong Myon Kim. An Effective Envelope Analysis Using Gaussian Windows for Evaluation of Fault Severity in Bearing. In Kuinam J. Kim, Nakhoon Baek, editors, Information Science and Applications 2018 - ICISA 2018, Hong Kong, China, June 25-27th, 2018. Volume 514 of Lecture Notes in Electrical Engineering, pages 457-464, Springer, 2018. [doi]
Abstract is missing.