Vu Nguyen, Michael Blumenstein. A Compact Size Feature Set for the Off-Line Signature Verification Problem. In Michael Blumenstein, Umapada Pal, Seiichi Uchida, editors, 10th IAPR International Workshop on Document Analysis Systems, DAS 2012, Gold Coast, Queenslands, Australia, March 27-29, 2012. pages 261-265, IEEE, 2012. [doi]
Abstract is missing.