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Study for the non-contact characterization of metallization ageing of power electronic semiconductor devices using the eddy current technique

T. A. Nguyen, P.-Y. Joubert, S. Lefebvre, G. Chaplier, L. Rousseau. Study for the non-contact characterization of metallization ageing of power electronic semiconductor devices using the eddy current technique. Microelectronics Reliability, 51(6):1127-1135, 2011. [doi]

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