Khai Nguyen, Geoff Liang. Modelling Degradation of Matched-Circuits in Operational Conditions: Active and Stand-by Modes. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-5, IEEE, 2019. [doi]
@inproceedings{NguyenL19-3,
title = {Modelling Degradation of Matched-Circuits in Operational Conditions: Active and Stand-by Modes},
author = {Khai Nguyen and Geoff Liang},
year = {2019},
doi = {10.1109/IRPS.2019.8720593},
url = {https://doi.org/10.1109/IRPS.2019.8720593},
researchr = {https://researchr.org/publication/NguyenL19-3},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019},
publisher = {IEEE},
isbn = {978-1-5386-9504-3},
}