Duc Phuc Nguyen, Khoa LeTrung, Fakhreddine Ghaffari, David Declercq. Reliability Enhancement for Multi-level Cell NAND Flash Memory Using Error Asymmetry. In 25th Asia-Pacific Conference on Communications, APCC 2019, Ho Chi Minh City, Vietnam, November 6-8, 2019. pages 502-506, IEEE, 2019. [doi]
@inproceedings{NguyenLGD19-0,
title = {Reliability Enhancement for Multi-level Cell NAND Flash Memory Using Error Asymmetry},
author = {Duc Phuc Nguyen and Khoa LeTrung and Fakhreddine Ghaffari and David Declercq},
year = {2019},
doi = {10.1109/APCC47188.2019.9026538},
url = {https://doi.org/10.1109/APCC47188.2019.9026538},
researchr = {https://researchr.org/publication/NguyenLGD19-0},
cites = {0},
citedby = {0},
pages = {502-506},
booktitle = {25th Asia-Pacific Conference on Communications, APCC 2019, Ho Chi Minh City, Vietnam, November 6-8, 2019},
publisher = {IEEE},
isbn = {978-1-7281-3679-0},
}