Reliability Enhancement for Multi-level Cell NAND Flash Memory Using Error Asymmetry

Duc Phuc Nguyen, Khoa LeTrung, Fakhreddine Ghaffari, David Declercq. Reliability Enhancement for Multi-level Cell NAND Flash Memory Using Error Asymmetry. In 25th Asia-Pacific Conference on Communications, APCC 2019, Ho Chi Minh City, Vietnam, November 6-8, 2019. pages 502-506, IEEE, 2019. [doi]

Abstract

Abstract is missing.