Van-Duc Nguyen, J. Alison Noble, Joseph L. Mundy, John Janning, Joseph Ross. Exhaustive Detection of Manufacturing Flaws as Abnormalities. In 1998 Conference on Computer Vision and Pattern Recognition (CVPR 98), June 23-25, 1998, Santa Barbara, CA, USA. pages 945-952, IEEE Computer Society, 1998. [doi]
@inproceedings{NguyenNMJR98,
title = {Exhaustive Detection of Manufacturing Flaws as Abnormalities},
author = {Van-Duc Nguyen and J. Alison Noble and Joseph L. Mundy and John Janning and Joseph Ross},
year = {1998},
url = {http://dlib2.computer.org/conferen/cvpr/8497/pdf/84970945.pdf},
researchr = {https://researchr.org/publication/NguyenNMJR98},
cites = {0},
citedby = {0},
pages = {945-952},
booktitle = {1998 Conference on Computer Vision and Pattern Recognition (CVPR 98), June 23-25, 1998, Santa Barbara, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-8186-8497-6},
}