Van-Duc Nguyen, J. Alison Noble, Joseph L. Mundy, John Janning, Joseph Ross. Exhaustive Detection of Manufacturing Flaws as Abnormalities. In 1998 Conference on Computer Vision and Pattern Recognition (CVPR 98), June 23-25, 1998, Santa Barbara, CA, USA. pages 945-952, IEEE Computer Society, 1998. [doi]
Abstract is missing.