Topic-based defect prediction: NIER track

Tung Thanh Nguyen, Tien N. Nguyen, Tu Minh Phuong. Topic-based defect prediction: NIER track. In Richard N. Taylor, Harald Gall, Nenad Medvidovic, editors, Proceedings of the 33rd International Conference on Software Engineering, ICSE 2011, Waikiki, Honolulu , HI, USA, May 21-28, 2011. pages 932-935, ACM, 2011. [doi]

Authors

Tung Thanh Nguyen

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Tien N. Nguyen

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Tu Minh Phuong

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