Tung Thanh Nguyen, Tien N. Nguyen, Tu Minh Phuong. Topic-based defect prediction: NIER track. In Richard N. Taylor, Harald Gall, Nenad Medvidovic, editors, Proceedings of the 33rd International Conference on Software Engineering, ICSE 2011, Waikiki, Honolulu , HI, USA, May 21-28, 2011. pages 932-935, ACM, 2011. [doi]
@inproceedings{NguyenNP11,
title = {Topic-based defect prediction: NIER track},
author = {Tung Thanh Nguyen and Tien N. Nguyen and Tu Minh Phuong},
year = {2011},
doi = {10.1145/1985793.1985950},
url = {http://doi.acm.org/10.1145/1985793.1985950},
tags = {rule-based},
researchr = {https://researchr.org/publication/NguyenNP11},
cites = {0},
citedby = {0},
pages = {932-935},
booktitle = {Proceedings of the 33rd International Conference on Software Engineering, ICSE 2011, Waikiki, Honolulu , HI, USA, May 21-28, 2011},
editor = {Richard N. Taylor and Harald Gall and Nenad Medvidovic},
publisher = {ACM},
isbn = {978-1-4503-0445-0},
}