Van Huan Nguyen, Van Huy Pham, Xuenan Cui, Mingjie Ma, Hakil Kim. Design and evaluation of features and classifiers for OLED panel defect recognition in machine vision. J. Information Telecommunication, 1(4):334-350, 2017. [doi]
@article{NguyenPCMK17,
title = {Design and evaluation of features and classifiers for OLED panel defect recognition in machine vision},
author = {Van Huan Nguyen and Van Huy Pham and Xuenan Cui and Mingjie Ma and Hakil Kim},
year = {2017},
doi = {10.1080/24751839.2017.1355717},
url = {https://doi.org/10.1080/24751839.2017.1355717},
researchr = {https://researchr.org/publication/NguyenPCMK17},
cites = {0},
citedby = {0},
journal = {J. Information Telecommunication},
volume = {1},
number = {4},
pages = {334-350},
}