Thuy Tuong Nguyen, Xuan Dai Pham, Dongkyun Kim, Jae Wook Jeon. Automatic exposure compensation for line detection applications. In IEEE International Conference on Multisensor Fusion and Integration for Intelligent Systems, MFI 2008, Seoul, South Korea, August 20-22, 2008. pages 68-73, IEEE, 2008. [doi]
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