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TCAD simulation of radiation-induced leakage current in 1T1C SDRAM

Hoang T. Nguyen, A. Rodriguez, F. Wrobel, A. Michez, F. Bezerra, N. Chatry, B. Vandevelde. TCAD simulation of radiation-induced leakage current in 1T1C SDRAM. Microelectronics Reliability, 88:974-978, 2018. [doi]

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Hoang T. Nguyen

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A. Rodriguez

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F. Wrobel

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A. Michez

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F. Bezerra

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N. Chatry

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B. Vandevelde

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