TCAD simulation of radiation-induced leakage current in 1T1C SDRAM

Hoang T. Nguyen, A. Rodriguez, F. Wrobel, A. Michez, F. Bezerra, N. Chatry, B. Vandevelde. TCAD simulation of radiation-induced leakage current in 1T1C SDRAM. Microelectronics Reliability, 88:974-978, 2018. [doi]

Abstract

Abstract is missing.