Huy Toan Nguyen, Nu-ri Shin, Gwanghyun Yu, Gyeong-Ju Kwon, Woo-Young Kwak, Jin Young Kim. Deep learning-based defective product classification system for smart factory. In SMA 2020: The 9th International Conference on Smart Media and Applications, Jeju, Republic of Korea, September 17 - 19, 2020. pages 80-85, ACM, 2020. [doi]
Abstract is missing.