Van Tham Nguyen, Trong Hieu Tran. Inconsistency measures for probabilistic knowledge bases. In Thanh Thuy Nguyen, Anh-Phuong Le, Satoshi Tojo, Le Minh Nguyen, Xuan Hieu Phan, editors, 9th International Conference on Knowledge and Systems Engineering, KSE 2017, Hue, Vietnam, October 19-21, 2017. pages 148-153, IEEE, 2017. [doi]
Abstract is missing.